JPH0468582B2 - - Google Patents

Info

Publication number
JPH0468582B2
JPH0468582B2 JP15170987A JP15170987A JPH0468582B2 JP H0468582 B2 JPH0468582 B2 JP H0468582B2 JP 15170987 A JP15170987 A JP 15170987A JP 15170987 A JP15170987 A JP 15170987A JP H0468582 B2 JPH0468582 B2 JP H0468582B2
Authority
JP
Japan
Prior art keywords
light
prism
measured
half mirror
parallel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP15170987A
Other languages
English (en)
Japanese (ja)
Other versions
JPS63314446A (ja
Inventor
Shigeo Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP15170987A priority Critical patent/JPS63314446A/ja
Publication of JPS63314446A publication Critical patent/JPS63314446A/ja
Publication of JPH0468582B2 publication Critical patent/JPH0468582B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/57Measuring gloss

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP15170987A 1987-06-18 1987-06-18 光沢度測定装置 Granted JPS63314446A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15170987A JPS63314446A (ja) 1987-06-18 1987-06-18 光沢度測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15170987A JPS63314446A (ja) 1987-06-18 1987-06-18 光沢度測定装置

Publications (2)

Publication Number Publication Date
JPS63314446A JPS63314446A (ja) 1988-12-22
JPH0468582B2 true JPH0468582B2 (en]) 1992-11-02

Family

ID=15524555

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15170987A Granted JPS63314446A (ja) 1987-06-18 1987-06-18 光沢度測定装置

Country Status (1)

Country Link
JP (1) JPS63314446A (en])

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2616090B2 (ja) * 1990-01-25 1997-06-04 トヨタ自動車株式会社 塗面の光沢度測定装置

Also Published As

Publication number Publication date
JPS63314446A (ja) 1988-12-22

Similar Documents

Publication Publication Date Title
US4402607A (en) Automatic detector for microscopic dust on large-area, optically unpolished surfaces
US5767975A (en) Method and device for detecting the position for a crease line of a packaging web
US5076692A (en) Particle detection on a patterned or bare wafer surface
JP3140664B2 (ja) 異物検査方法及び装置
KR930703594A (ko) 동시 다중각/다중파장 타원편광계와 측정방법
JP4130236B2 (ja) 物体表面形状測定方法及び装置
JPH04157339A (ja) 粒径・速度測定装置
JPH0468582B2 (en])
JPS63140904A (ja) 散乱光測定装置
JPH0541407Y2 (en])
JP3871415B2 (ja) 分光透過率測定装置
JPH0754291B2 (ja) 粒度分布測定装置
JPH03115844A (ja) 表面欠点検出方法
JPH0566235B2 (en])
KR100205532B1 (ko) 분체의 수분 측정장치
JP2512050Y2 (ja) 非接触検出装置における観察装置
JPH0729452Y2 (ja) 変位測定装置
JPH1090158A (ja) 浮遊粒子群の濃度及び粒度の測定装置
JPH0725618Y2 (ja) 変位測定装置
JPH09236408A (ja) 焦点位置検出装置
JPH045556A (ja) 球体表面の傷検査装置
JPH0642168Y2 (ja) 平滑・光沢度計
WO2019202648A1 (ja) 光散乱検出装置
JPH07119703B2 (ja) 表面欠陥検査装置
JP2523156B2 (ja) 屈折角測定方法及び屈折率分布測定装置